Project Science: Characterization of the XSS

Table of contents

Introduction. Click here for 1.8 Meg PostScript file.

Electron-Impact Point Source (EIPS) and Filter Wheel Assembly (FWA). Click here for 3.3 Meg PostScript file.

Rotating-Anode Source (RAS). Click here for 1.6 Meg PostScript file.

High-Resolution Erect-Field Spectrometer (HIREFS). Click here for 6.4 Meg PostScript file.

Double Crystal Monochromator (DCM). Click here for 3.9 Meg PostScript file.

Penning Ionization Gas-Discharge Source (PIGS). Click here for 4.9 Meg PostScript file.

Some of the data displayed in the above documents are available in ascii tables. These include:

HIREFS SA Coarse Scan (5 orders, 10 to 50 Angstroms)

HIREFS SX Coarse Scan. (2 orders, 6 to 16 Angstroms)

HIREFS SB Coarse Scan (1st 5 orders, 30.5 to 120 Angstroms)

HIREFS SB Coarse Scan (last 5 orders, 30.5 to 120 Angstroms)

DCM TAP Coarse Scan (1st and 3rd Order, 0.75 to 2.4 keV)

DCM Ge Coarse Scan (1st and 3rd Order, 2 to 9 keV)

DCM aSi Coarse Scan (1st Order, 6 to 12 keV)

Optical depth of filters at measured lines.

EIPS estimated fluxes for various filters and operating voltages

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